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    Title :

    X-ray investigation of the relaxation and diffusion behavior of strained SiGe/Si structures under hydrostatic pressure at high temperatures [3179-32]



    Conference:

    Symposium; 12th, Solid state crystals: materials science and applications: Solid state crystals in opteolectronics and semiconductor technology ; 1996 ; Zakopane; Poland



    Publication date :

    1996-01-01


    Size :

    4 pages


    Remarks:

    Also known as SSCs'96




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Nr. 3179

    DataCite | 1906


    Nanocrystalline diamond for medicine [3179-14]

    Mitura, S. / Military University of Technology, Warsaw; Institute of Applied Physics | British Library Conference Proceedings | 1996


    Isotype heterojunction in HgCdTe photodiodes [3179-41]

    Rutkowski, J. / Jozwikowska, A. / Military University of Technology, Warsaw; Institute of Applied Physics | British Library Conference Proceedings | 1996


    Time-resolved spectroscopy of low-dimensional structures based on porous silicon [3179-07]

    Lukasiak, Z. / Bala, W. / Kowalczyk, A. et al. | British Library Conference Proceedings | 1996


    Photoreflectance spectroscopy for investigations of semiconductor structures (Invited Paper) [3179-20]

    Misiewicz, J. / Military University of Technology, Warsaw; Institute of Applied Physics | British Library Conference Proceedings | 1996