Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Chemical state mapping on material surfaces with the X1A second-generation scanning photoemission microscope (X1A SPEM-II) (Invited Paper) [2516-18]


    Contributors:
    Ko, C.-H. (author) / Kirz, J. (author) / Maier, K. (author) / Winn, B. (author) / Yun, W. / SPIE

    Conference:

    Conference, X-ray microbeam technology and applcations ; 1995 ; San Diego; CA



    Publication date :

    1995-01-01


    Size :

    10 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Scanning transmission x-ray microscope at the NSLS: from XANES to cryo (Invited Paper) [2516-08]

    Maser, J. M. / Chapman, H. N. / Jacobsen, C. J. et al. | British Library Conference Proceedings | 1995


    Ultrahigh-resolution soft x-ray tomography (Invited Paper) [2516-10]

    Haddad, W. S. / Trebes, J. E. / Goodman, D. M. et al. | British Library Conference Proceedings | 1995


    X-ray microscopy with high-resolution zone plates: recent developments (Invited Paper) [2516-09]

    Schneider, G. / Wilhein, T. / Niemann, B. et al. | British Library Conference Proceedings | 1995


    Tomographic scanning microscope for 1- to 4-KeV x rays [2516-28]

    McNulty, I. / Feng, Y. P. / Haddad, W. S. et al. | British Library Conference Proceedings | 1995


    Bragg-Fresnel optics at the ESRF: microdiffraction and microimaging applications (Invited Paper) [2516-03]

    Snigirev, A. A. / Kohn, V. / SPIE | British Library Conference Proceedings | 1995