Synonyme wurden verwendet für: Ellipsometrie
Suche ohne Synonyme: keywords:(Ellipsometrie)

1–15 von 15 Ergebnissen
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    In situ and ex situ ellipsometric characterization of oxygen plasma and UV radiation effects on spacecraft materials

    Bungay, C.L. / Tiwald, T.E. / DeVries, M.J. et al. | Tema Archiv | 1998
    Schlagwörter: Ellipsometrie , spektroskopische Ellipsometrie

    Variable angle of incidence spectroscopic ellipsometric characterization of TiO2/Ag/TiO2 optical coatings

    Memarzadeh, K. / Woollam, J.A. / Belkind, A. | Tema Archiv | 1988
    Schlagwörter: ELLIPSOMETRIE , INZIDENZSPEKTROSKOPISCHE ELLIPSOMETRIE

    Development of physical models for the simulation of optical properties of solar cell modules

    Vogt, Malte Ruben / Gottfried Wilhelm Leibniz Universität Hannover | TIBKAT | 2015
    Schlagwörter: Ellipsometrie

    ELLIPSOMETRIC METHODS FOR CONTROL OF PARAMETERS OF MATERIALS AND RADIOELECTRONICS STRUCTURES

    Freier Zugriff
    S. Bogolyubovа / E. Polyakova / R. Rezvyi | DOAJ | 2016
    Schlagwörter: ellipsometry methods and programs

    Development of physical models for the simulation of optical properties of solar cell modules

    Freier Zugriff
    Vogt, Malte Ruben / Gottfried Wilhelm Leibniz Universität Hannover | TIBKAT | 2015
    Schlagwörter: Ellipsometrie

    Post Flight Analysis of Optical Specimens from MISSE7

    A. F. Stewart / M. Finckenor | NTIS | 2012
    Schlagwörter: Ellipsometry

    CERMET THERMAL CONVERSION COATINGS FOR SPACE APPLICATIONS

    WOODS, BENJAMIN W. / THOMPSON, DANIEL W. / WOOLLAM, JOHN A. | Springer Verlag | 2006
    Schlagwörter: Spectroscopic Ellipsometry

    High durability antireflection coatings for silicon and multispectral ZnS

    Joseph, S. / Marcovitch, O. / Yadin, Y. et al. | Tema Archiv | 2007
    Schlagwörter: Ellipsometrie

    MIRAGE emitter improvements and technology review

    Solomon, S.L. / Irwin, A. / Oleson, J. et al. | Tema Archiv | 2001
    Schlagwörter: Ellipsometrie

    Iridium substrates for space contamination studies: Erosion rates under atomic oxygen exposure

    Li, Yan / Woollam, J.A. | Tema Archiv | 2003
    Schlagwörter: Ellipsometrie

    The use of electrochemistry and ellipsometry for identifying and evaluating corrosion on aircraft

    Dacres, C.M. / Taggart, B.C. / Anderson, C.R. et al. | Tema Archiv | 1995
    Schlagwörter: Ellipsometrie