ZnSe quality analysis by x-ray luminescence [2113-17]
Diagnostics of multilayer dielectric coating based on reflection and transmission spectra [2113-08]
Method and measuring device for micro-optics element assessment [2113-33]
Compound material investigation by spectroscopic ellipsometry [2113-12]
Optical diagnostics of quaternary narrow-gap semiconductors [2113-03]
Noninterference method of optical surface roughness measurements [2113-07]
Methods and systems of indestructible contact-free television control of micro-objects [2113-38]