Synonyme wurden verwendet für: SEM
Suche ohne Synonyme: keywords:("SEM")

1–20 von 152 Ergebnissen
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    Driver monitoring and drowsiness detection by steering signal analysis

    Altmüller, Tobias | Tema Archiv | 2007
    Schlagwörter: REM-Schlaf

    The Effect of Borax on the Friction Performance of an Automotive Brake Lining

    Sugozu, Ilker / Can, Ibrahim / Onerc, Cengiz | Tema Archiv | 2014
    Schlagwörter: Rasterelektronenmikroskop

    Adaptiver Spurverlassenswarner mit fahrerabsichts- und fahrerzustandsabhängiger Warnstrategie

    Schmitz, Carsten | Tema Archiv | 2005
    Schlagwörter: REM-Schlaf

    Effect of surface layers on the initiation of internal pitting corrosion in oil and gas pipelines

    Papavinasam, S. / Doiron, A. / Revie, R.W. | Tema Archiv | 2009
    Schlagwörter: REM (Rasterelektronenmikroskopie)

    Investigation of dynamic driving cycle effect on performance degradation and micro-structure change of PEM fuel cell

    Lin, R. / Li, B. / Hou, Y.P. et al. | Tema Archiv | 2009
    Schlagwörter: REM (Rasterelektronenmikroskopie)

    Ductile inclusions in rail, subject to compressive rolling-sliding contact

    Garnham, J.E. / Ding, R.G. / Davis, C.L. | Tema Archiv | 2010
    Schlagwörter: REM (Rasterelektronenmikroskopie)

    Evaluating the impact of a loyalty program: a case study in automobile industry

    Kim, Kwang-Jae / Kim, Hyun-Jin / Kwon, Ryeok-Hwan | Tema Archiv | 2010
    Schlagwörter: Rasterelektronenmikroskop

    Microstractoral and kinetic investigation of hydrogen sorption reaction of MgH2/Nb2O5 nanopowders

    Aurora, A. / Mancini, M.R. / Gattia, D. Mirabile et al. | Tema Archiv | 2009
    Schlagwörter: Rasterelektronenmikroskop

    Development of light and cost effective roof bracket

    Reich, I. / Wirtheim, A. / Rosenson, H. et al. | Tema Archiv | 2009
    Schlagwörter: REM (Rasterelektronenmikroskopie)

    Influence of surface electric discharges on behavior of cover glasses and solar array fragments

    Skurat, V.E. / Gatsenko, L.S. / Zhigach, A.N. et al. | Tema Archiv | 2012
    Schlagwörter: REM (Rasterelektronenmikroskopie)

    Mean flank temperature measurement in high speed dry cutting of magnesium alloy

    Fang, F.Z. / Lee, L.C. / Liu, X.D. | Tema Archiv | 2005
    Schlagwörter: Rasterelektronenmikroskop

    Effect of welding parameters on mechanical and microstructural properties of AA6082 joints produced by friction stir welding

    Cavaliere, P. / Squillace, A. / Panella, F. | Tema Archiv | 2008
    Schlagwörter: Rasterelektronenmikroskop

    Fly ash reinforced thermoplastic vulcanizates obtained from waste tire powder

    Sridhar, V. / Xiu, Zhang Zhen / Xu, Deng et al. | Tema Archiv | 2009
    Schlagwörter: Rasterelektronenmikroskop

    Altersbestimmung anhand eines Korrosionsproduktes

    Lang, Walter / Krause, Ralf | Tema Archiv | 2014
    Schlagwörter: Rasterelektronenmikroskop

    Effect of water spray on friction and wear behaviour of noncommercial and commercial brake pad materials

    El-Tayeb, N.S.M. / Liew, K.W. | Tema Archiv | 2008
    Schlagwörter: Rasterelektronenmikroskop

    Characteristics of extrude honed SG iron internal primitives

    Raju, H.P. / Narayanasamy, K. / Srinivasa, Y.G. et al. | Tema Archiv | 2005
    Schlagwörter: Rasterelektronenmikroskop

    Effect of grain refiner and grain size on the susceptibility of Al-Mg die casting alloy to cracking during solidification

    Kimura, Ryosuke / Hatayama, Haruaki / Shinozaki, Kenji et al. | Tema Archiv | 2009
    Schlagwörter: Rasterelektronenmikroskop

    Temperature-variant scratch deformation response of automotive paint systems

    Hainsworth, S.V. / Kilgallon, P.J. | Tema Archiv | 2008
    Schlagwörter: Rasterelektronenmikroskop

    Wear behaviour investigation of wheel/rail interface in water lubrication and dry friction

    Ozsarac, Ugur / Aslanlar, Salim | Tema Archiv | 2008
    Schlagwörter: REM (Rasterelektronenmikroskopie)

    Failures of welded titanium aircraft ducts

    Lynch, S.P. / Hole, B. / Pasang, T. | Tema Archiv | 1995
    Schlagwörter: Rasterelektronenmikroskop