1–6 von 6 Ergebnissen
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    Polarization properties of fully metal coated scanning near-field optical microscopy probes

    Vaccaro, L. / Aeschimann, L. / Nakagawa, W. et al. | IEEE | 2003

    Development of the "Space AFM" for interplanetary missions

    Howald, L. / Akiyama, T. / Gautsch, S. et al. | Tema Archiv | 2000

    Miniaturized atomic force microscope for planetary exploration

    Gautsch, S. / Staufer, U. / Akiyama, T. et al. | Tema Archiv | 2001

    Optical Microelectromechanical Systems (OMEMS) Based on Silicon-on-Insulator (SOI) Technology

    Noell, W. / Clerc, P.-A. / Guldimann, B. et al. | British Library Conference Proceedings | 2002

    Miniaturized atomic force microscope for planetary exploration

    Gautsch, S. / Staufer, U. / Akiyama, T. et al. | British Library Conference Proceedings | 2001

    Microsystems for diverse applications using recently developed microfabrication techniques [4179-202]

    Dellmann, L. / Akiyama, T. / Briand, D. et al. | British Library Conference Proceedings | 2000