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Infrarotdetektor
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keywords:("Infrarotdetektor")
HgCdTe for far-infrared heterodyne detection [5209-09]
High-operability SWIR HgCdTe focal plane arrays [5209-03]
MWIR HgCdTe avalanche photodiodes (Invited Paper) [4454-23]
High-sensitivity (25-mum pitch) microbolometer FPAs (Invited Paper) [4454-19]
Dark current transport mechanisms in narrow-gap heterojunctions for IR arrays [4454-18]
GaInAs/InP quantum well infrared photodetectors grown on Si substrates (Invited Paper) [4454-14]
Influences of performance parameters of GaAs/AlGaAs materials on photoemission [5209-20]
Superlattices for very long wavelength infrared detectors [5209-08]
Infrared detectors, state of the art : 23 - 24 July 1992, San Diego, California ; proceedings
Photocarrier extraction effect in thin variable-gap photoresistors [4454-37]
Proposed two-color HgCdTe focal plane array [4454-07]
Micro-Raman spectra of Cd~1~-~yZn~yTe crystals [4454-35]
Thermal infrared characterization of ground targets and backgrounds
Advances in linear and area HgCdTe APD arrays for eyesafe LADAR sensors (Invited Paper) [4454-24]
High-temperature HgCdTe/CdTe/Si infrared photon detectors by MBE [4454-22]
Dislocations in HgCdTe (111)B films [4795-14]
Progress in far-infrared detection technology [4795-21]
Progress in MBE growth of HgCdTe at SITP [4795-05]
Annealing study of Cd~1~-~xZn~xTe crystals by IR transmission and micro-Raman spectrum [4795-30]
Optical and electronic characterization on HgCdTe materials [4795-11]
QWIP structural optimization (Invited Paper) [4795-07]
Intermixing effect on asymmetric quantum well [4795-06]
Influence of photoresist feature geometry on ECR plasma-etched HgCdTe frenches [4795-23]
Minority carrier lifetime in abrupt MBE-grown HgCdTe heterostructures [4795-37]
HgCdTe long-wavelength infrared photovoltaic detectors formed by reactive ion etching [4795-25]
Fourth International Conference on Advanced Infrared Detectors and Systems, 5-7 June 1990
Development and evaluation of a novel large-area single-pixel QWIP for infrared radiometry [5209-22]
Building a robust self-test on multimode seeker (MMS) system [5209-19]
Polycrystalline SiGe technology for uncooled microbolometer arrays [5209-10]