1–12 von 12 Ergebnissen
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    Update on NASA Microelectronics Activities

    Label, Kenneth A. / Sampson, Michael J. / Casey, Megan et al. | NTRS | 2017

    Single-Event Threats for Diodes - It's Not Just Schottky Diodes

    Casey, Megan C. / Lauenstein, Jean-Marie / Wilcox, Edward P. et al. | NTRS | 2017

    Solar Electric Propulsion Technology Development for Electric Propulsion

    Mercer, Carolyn R. / Kerslake, Thomas W. / Scheidegger, Robert J. et al. | NTRS | 2015

    Compendium of Single Event Effect Results from NASA Goddard Space Flight Center

    O'Bryan, Martha V. / LaBel, Kenneth A. / Szabo, Carl M. et al. | NTRS | 2016

    High Temperature Boost (HTB) Anode Power Supply for a modular and scalable power processing unit

    Carr, Gregory A. / Iannello, Christopher J. / Hunter, Don J. et al. | IEEE | 2016

    High temperature anode power supply parts and packaging reliability and survivability

    Del Castillo, Linda / Weber, Carissa Tudryn / Mojarradi, Mohammad et al. | IEEE | 2016

    Compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA

    Campola, Michael J. / Cochran, Donna J. / Boutte, Alvin J. et al. | NTRS | 2015

    Compendium of Total Ionizing Dose and Displacement Damage Results from NASA Goddard Spaceflight Center

    Campola, Michael J. / Cochran, Donna J. / Alt, Shannon et al. | NTRS | 2016

    Compendium of Total Ionizing Dose and Displacement Damage Results from NASA Goddard Space Flight Center

    Campola, Michael J. / Cochran, Donna J. / Alt, Shannon et al. | NTRS | 2016

    Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

    O'Bryan, Martha V. / LaBel, Kenneth A. / Pellish, Jonathan A. et al. | IEEE | 2009