We present destructive single-event effects characterization of a variety of silicon Schottky diodes from different manufacturers. We also discuss suitable derating guidelines.


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    Titel :

    Single-Event Threats for Diodes - It's Not Just Schottky Diodes


    Beteiligte:

    Kongress:

    Single Event Effects (SEE) Symposium and Military and Aerospace Programmable Logic Devices (MAPLD) Workshop ; 2017 ; La Jolla, CA, United States


    Erscheinungsdatum :

    2017-05-22


    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch




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