1–11 von 11 Ergebnissen
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keywords:(schweres Ion)

    Heavy-ion induced single event upsets in a bipolar logic device

    Kolasinski, W.A. / Koga, R. | Tema Archiv | 1983
    Schlagwörter: SCHWERES ION

    Prise en compte de l'environnement spatial

    Boudenot, J.C. / Fillon, T. / Barrillot, C. et al. | Tema Archiv | 1999
    Schlagwörter: schweres Ion

    Hybrid amplifier modules for nuclear measurements in space flight experiments

    Funk, W. / Winkelnkemper, W. | Tema Archiv | 1979
    Schlagwörter: SCHWERES ION

    Single-event-effect mitigation from a system perspective

    LaBel, K.A. / Gates, M.M. | Tema Archiv | 1996
    Schlagwörter: schweres Ion

    The influence of VLSI technology evolution on radiation-induced latchup in space systems

    Johnston, A.H. | Tema Archiv | 1996
    Schlagwörter: schweres Ion

    Cosmic and terrestrial single-event radiation effects in dynamic random access memories

    Massengill, L.W. | Tema Archiv | 1996
    Schlagwörter: schweres Ion

    Experimental study on heavy ion single event effects in SOI SRAMs

    Li, Yonghong / He, Chaohui / Zhao, Fazhan et al. | Tema Archiv | 2009
    Schlagwörter: schweres Ion

    A review of the techniques used for modeling single-event effects in power MOSFET's

    Johnson, G.H. / Palau, J.M. / Dachs, C. et al. | Tema Archiv | 1996
    Schlagwörter: schweres Ion

    Single-event effect ground test issues

    Koga, R. | Tema Archiv | 1996
    Schlagwörter: schweres Ion

    Recent trends in parts SEU susceptibility from heavy ions

    Nichols, D.K. / Smith, L.S. / Price, W.E. et al. | Tema Archiv | 1987
    Schlagwörter: SCHWERES ION

    Recent trends in single-event effect ground testing

    Duzellier, S. / Ecoffet, R. | Tema Archiv | 1996
    Schlagwörter: schweres Ion