Synonyme wurden verwendet für: Halbleiterbauelement
Suche ohne Synonyme: keywords:("Halbleiterbauelement")

41–60 von 150 Ergebnissen
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    Optimization of optical coatings for the UV/VUV range (Invited Paper) [5188-11]

    Ristau, D. / Gunster, S. / International Society for Optical Engineering | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Single steady frequency and narrow-linewidth external-cavity semiconductor laser [5188-46]

    Zhao, W. / Jiang, P. / Xie, F. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Enhancement and quenching of the fluorescence of single CdSe/ZnS quantum dots studied by confocal apertureless near-field scanning optical microscope [5188-31]

    Protasenko, V. V. / Gallagher, A. / Labardi, M. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    A review of the emerging SEMI standards for particle scanners [5188-48]

    Stover, J. C. / International Society for Optical Engineering | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Laser-induced fluorescence of calcium fluoride at 193 and 157 nm excitation [5188-15]

    Muhlig, C. / Triebel, W. / Topfer, G. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    An automated subaperture stitching interferometer workstation for spherical and aspherical surfaces [5188-38]

    Fleig, J. / Dumas, P. / Murphy, P. E. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Comparative linewidth measurements on chrome and MoSi structures using newly developed microscopy methods [5188-40]

    Bodermann, B. / Mirande, W. / Kerwien, N. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Characterization procedures for nanorough ultrahydrophobic surfaces with controlled optical matter [5188-30]

    Flemming, M. / Reihs, K. / Duparre, A. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Characterization of Ag-Sb-Te alloy and its films for phase-change optical memories [5188-27]

    Sharma, Y. D. / Bhatnagar, P. K. / International Society for Optical Engineering | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Digital demodulation of an interferometer for the characterization of vibrating microstructures [5188-08]

    Pitt, B. D. / Tayag, T. J. / Nelson, M. L. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Recent advances in the development of phase-shifting liquid crystal interferometers for visible and near-IR applications [5188-07]

    Marshall, K. L. / Klehn, B. / Watson, B. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Optical characterization in wide spectral range by a coherent spectrophotometer [5188-05]

    Sirutkaitis, V. / Eckardt, R. C. / Balachninaite, O. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Characterization of polarization aberrations in liquid crystal devices (Invited Paper) [5188-01]

    Wolfe, J. / Chipman, R. / International Society for Optical Engineering | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Localization of sub-100-nm particles on wafers with solid state detector arrays [5188-35]

    Rinder, T. / Rothe, H. / International Society for Optical Engineering | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Manufacturability considerations in designing optical monitoring methods for control of plasma etch processes [5188-03]

    Venugopal, V. C. / Perry, A. J. / Wallace, K. V. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Mueller matrix polarimeter in 157 nm [5188-18]

    Jin, L. / Kowa, H. / Otani, Y. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Double-diode configuration of self-calibrating photodiodes [5188-42]

    Guryev, M. / Kupko, A. / Nazarenko, L. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Phase-shifting algorithm via wavelength tuning based on temporal Fourier transform [5188-41]

    Yu, Y. / Zhang, B. / Jiao, Y. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Absolute high-accuracy deflectometric measurement of topography [5188-39]

    Illemann, J. / International Society for Optical Engineering | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Advanced industrial fluorescence metrology used for qualification of high-quality optical materials [5188-23]

    Engel, A. / Becker, H.-J. / Sohr, O. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors