1–5 von 5 Ergebnissen
|

Ihre Suche:
number:(IETNAE)

    Single event gate rupture in thin gate oxides

    Sexton, F.W. / Fleetwood, D.M. / Shaneyfelt, M.R. et al. | Tema Archiv | 1997

    Radiation shielding study of advanced data and power management systems (ADPMS) housing using Geant4

    Garcia, F. / Kurvinen, K. / Brander, T. et al. | Tema Archiv | 2008

    SRAM based re-programmable FPGA for space applications

    Wang, J.J. / Katz, R.B. / Sun, J.S. et al. | Tema Archiv | 1999

    Impact of aging on radiation hardness(CMOS SRAMs)

    Shaneyfelt, M.R. / Winokur, P.S. / Fleetwood, D.M. et al. | Tema Archiv | 1997

    Single event latchup threshold estimation based on laser dose rate test results

    Chumakov, A.I. / Egorov, A.N. / Mavritsky, O.B. et al. | Tema Archiv | 1997