1–20 von 130 Ergebnissen
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    Methods and systems of indestructible contact-free television control of micro-objects [2113-38]

    Svechnikov, S. V. / Khorushenko, V. U. / Samoilova, I. A. et al. | British Library Conference Proceedings | 1994
    Beteiligte: Svechnikov, S. V.

    Laser-thermal diagnostics of multilayer opto- and microelectronic structures (Invited Paper) [2113-29]

    Svechnikov, S. V. / Fedorenko, L. L. / Kaganovich, E. B. et al. | British Library Conference Proceedings | 1994
    Beteiligte: Svechnikov, S. V.

    Low-dimensional Si structures prepared by laser deposition [3182-34]

    Svechnikov, S. V. / Kaganovich, E. B. / Manoilov, E. G. et al. | British Library Conference Proceedings | 1997

    Laser-thermal diagnostics (LTD) of hidden inhomogeneities in multilayer structures [4430-75]

    Fedorenko, L. L. / Naumov, V. V. / Plakhotny, V. et al. | British Library Conference Proceedings | 2001

    Some distinctions of diffractive grating writing on the platelet CdS single crystal [2108-74]

    Kamuz, A. M. / Pocherpailo, A. I. / Svechnikov, S. V. et al. | British Library Conference Proceedings | 1993

    Diagnostics of third-order nonlinear materials by nonlinear coherent polarimetry based on vector two-wave mixing (Invited Paper) [2113-24]

    Taranenko, V. B. / Bazhenov, V. Y. / Kulikovskaya, O. A. et al. | British Library Conference Proceedings | 1994
    Beteiligte: Svechnikov, S. V.

    Stress diagnostics in the plates of semiconductor crystals by means of light polarization modulation [2113-23]

    Serdega, B. K. / Zykov, V. G. / SPIE | British Library Conference Proceedings | 1994
    Beteiligte: Svechnikov, S. V.

    ZnSe quality analysis by x-ray luminescence [2113-17]

    Artamonova, A. A. / Degoda, V. Y. / Rodionov, V. E. et al. | British Library Conference Proceedings | 1994
    Beteiligte: Svechnikov, S. V.

    Photoluminescence characterization of silicon subjected to various industrial treatments (Invited Paper) [2113-14]

    Valakh, M. Y. / Rudko, G. Y. / Shakhraychuk, N. I. et al. | British Library Conference Proceedings | 1994
    Beteiligte: Svechnikov, S. V.

    Diagnostics of multilayer dielectric coating based on reflection and transmission spectra [2113-08]

    Pervak, Y. A. / Fekeshgazi, I. V. / SPIE | British Library Conference Proceedings | 1994
    Beteiligte: Svechnikov, S. V.

    Diagnostics of the parameters, mechanism, and nature of the cadmium iodide crystal light sensitivity by optical absorption spectroscopy [2113-06]

    Bondar, V. D. / SPIE | British Library Conference Proceedings | 1994
    Beteiligte: Svechnikov, S. V.

    Luminescence profiling: a diagnostic method for an impurities-defects system in semiconductor materials [2113-18]

    Babentsov, V. N. / Vlasenko, A. I. / Tarbaev, N. I. et al. | British Library Conference Proceedings | 1994
    Beteiligte: Svechnikov, S. V.

    Compound material investigation by spectroscopic ellipsometry [2113-12]

    Litovchenko, V. G. / Frolov, S. I. / Klyui, N. I. et al. | British Library Conference Proceedings | 1994
    Beteiligte: Svechnikov, S. V.

    Optical diagnostics of quaternary narrow-gap semiconductors [2113-03]

    Tarasov, G. G. / Mazur, Y. I. / Tomm, J. W. et al. | British Library Conference Proceedings | 1994
    Beteiligte: Svechnikov, S. V.

    Recharging of local centers and diagnostics of laser and nonlinear crystals (Invited Paper) [2113-28]

    Gorban, I. S. / Gumenjuk, A. F. / Kutovoy, S. Y. et al. | British Library Conference Proceedings | 1994
    Beteiligte: Svechnikov, S. V.

    Spectral-luminescent determination of radiation-induced changes in scintillator crystals of registering systems [2113-15]

    Belyi, M. U. / Nedelko, S. G. / Diab, M. et al. | British Library Conference Proceedings | 1994
    Beteiligte: Svechnikov, S. V.

    Multiple charging of recombination centers as one of the causes of semiconductor scintillator inertiality [2113-27]

    Ryzhikov, V. D. / Suprunenko, V. N. / Vakulenko, O. V. et al. | British Library Conference Proceedings | 1994
    Beteiligte: Svechnikov, S. V.

    Noninterference method of optical surface roughness measurements [2113-07]

    Kalugin, V. V. / Trofimov, A. V. / Zuniga, V. L. et al. | British Library Conference Proceedings | 1994
    Beteiligte: Svechnikov, S. V.

    Spectral diagnostics of microelectronic material surface structure with high spatial resolution [2113-05]

    Bobrovskaya, I. P. / Chepilko, A. G. / Levash, L. V. et al. | British Library Conference Proceedings | 1994
    Beteiligte: Svechnikov, S. V.

    Optical/digital system for measurements and diagnostics of surface properties of materials for micro- and optoelectronics [2113-35]

    Bachevsky, R. S. / Dostojny, V. A. / Muravsky, L. I. et al. | British Library Conference Proceedings | 1994
    Beteiligte: Svechnikov, S. V.