Synonyme wurden verwendet für:
metrology
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keywords:(optical metrology)
2D-area/3D-volume holographic optical storage nanotechnology [4099-22]
4D volumetric imaging system [4877-35]
Accuracy of the thin metallic wires diameter using Fraunhofer diffraction technique [4099-31]
Accurate sizing of deposited PSL spheres from light scatter measurements [4449-19]
Adaptive edge detection using image variance [4877-11]
Adaptive wavelet eye-gaze-based video compression [4877-32]
Adaptive wavelet processing techniques for weak feature emphasis and extraction [4877-09]
Advanced methods for surface and subsurface defect characterization of optical components [4099-34]
AFM tip calibration using nanometer-sized structures induced by ion beam sputtering [4449-28]
Application of deconvolution to images from the EGRET gamma-ray telescope [4877-26]
Automated high-accuracy measuring system for specular microreflectivity [4449-15]
Automated synthesis, insertion, and detection of polyps for CT colonography [4877-23]
Bayesian segmentation and clustering for determining cloud mask images [4877-19]
Benchmarking segmentation results using a Markov model and a Bayes information criterion [4877-31]
Calibration requirements for identifying and sizing wafer defects by scanner measurements [4099-38]
Calibration tool for a CCD-camera-based vision system [4099-19]
Characteristics of tantalum oxynitride films prepared by rf magnetron sputtering [4099-30]
Correction of geometric image distortion using FPGAs [4877-02]