Synonyme wurden verwendet für: metrology
Suche ohne Synonyme: keywords:(optical metrology)

1–20 von 95 Ergebnissen
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    2D-area/3D-volume holographic optical storage nanotechnology [4099-22]

    Thomas, M. E. / SPIE | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    4D volumetric imaging system [4877-35]

    Ansbro, E. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Accuracy of the thin metallic wires diameter using Fraunhofer diffraction technique [4099-31]

    Serroukh, I. / Martinez-Anton, J. C. / Bernabeu, E. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    Accurate sizing of deposited PSL spheres from light scatter measurements [4449-19]

    Stover, J. C. / Scheer, C. A. / SPIE | British Library Conference Proceedings | 2001
    Schlagwörter: optical metrology

    Adaptive edge detection using image variance [4877-11]

    Coleman, S. A. / Scotney, B. W. / Herron, M. G. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Adaptive wavelet eye-gaze-based video compression [4877-32]

    Farid, M. M. / Kurugollu, F. / Murtagh, F. D. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Adaptive wavelet processing techniques for weak feature emphasis and extraction [4877-09]

    Brown, T. J. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Advanced methods for surface and subsurface defect characterization of optical components [4099-34]

    Steinert, J. / Gliech, S. / Wuttig, A. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    Advantages of a new subnanometer aspheric profiling technique with respect to the unique requirements of EUV lithography mirrors [4449-24]

    Glenn, P. E. / SPIE | British Library Conference Proceedings | 2001
    Schlagwörter: optical metrology

    AFM tip calibration using nanometer-sized structures induced by ion beam sputtering [4449-28]

    Frost, F. / Hirsch, D. / Schindler, A. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: optical metrology

    Application of deconvolution to images from the EGRET gamma-ray telescope [4877-26]

    Charalabides, S. / Shearer, A. / Butler, R. F. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Automated high-accuracy measuring system for specular microreflectivity [4449-15]

    Grunwald, R. / Nerreter, S. / Tomm, J. W. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: optical metrology

    Automated synthesis, insertion, and detection of polyps for CT colonography [4877-23]

    Sezille, N. / Sadleir, R. J. T. / Whelan, P. F. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Bayesian segmentation and clustering for determining cloud mask images [4877-19]

    Barreto, D. / Murtagh, F. D. / Marcello, J. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Benchmarking segmentation results using a Markov model and a Bayes information criterion [4877-31]

    Murtagh, F. D. / Qiao, X. / Crookes, D. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Calibration requirements for identifying and sizing wafer defects by scanner measurements [4099-38]

    Stover, J. C. / Scheer, C. A. / SPIE | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    Calibration tool for a CCD-camera-based vision system [4099-19]

    Xu, G. / Tan, S. L. / Low, S. P. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    Characteristics of tantalum oxynitride films prepared by rf magnetron sputtering [4099-30]

    Jong, C. A. / Chin, T. S. / SPIE | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    Combined metrology including VUV spectroscopic ellipsometer and grazing x-ray reflectance for precise characterization of thin films and multilayers at 157 nm [4449-06]

    Boher, P. / Evrard, P. / Piel, J. P. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: optical metrology

    Correction of geometric image distortion using FPGAs [4877-02]

    Eadie, D. / Shevlin, F. P. / Nisbet, A. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology