1–5 von 5 Ergebnissen
|

    Precise measurement of optical constants of Si for short-wavelength far-infrared region

    Nakayama, K. / Okajima, S. / Ohkuma, H. et al. | IEEE | 2004

    RA2-5 Temperature Dependence Of Optical Constants Of Silicon For Short Wavelength FIR Laser Lines

    Nakayama, K. / Okajima, S. / Ohkuma, H. et al. | British Library Conference Proceedings | 2005