Using far-infrared (FIR) lasers of 119, 71, 57, and 48 /spl mu/m in wavelength, optical constants (refractive index and absorption coefficient) of a high resistive silicon at 10, 19, and 29/spl deg/C have been measured in order to design a window and a beam splitter of a multi-channel measurement system such as fusion plasma diagnostics. The silicon has a resistivity of about 2.8 k/spl Omega//spl middot/cm. It has been found that the refractive index is sensitive for a change in the temperature. The window and the beam splitter at several temperatures have been designed.


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    Titel :

    Temperature dependence of optical constants of silicon for short wavelength FIR laser lines


    Beteiligte:
    Nakayama, K. (Autor:in) / Okajima, S. (Autor:in) / Ohkuma, H. (Autor:in) / Kawahata, K. (Autor:in) / Tanaka, K. (Autor:in) / Tokuzawa, T. (Autor:in) / Akiyama, T. (Autor:in) / Ito, Y. (Autor:in)


    Erscheinungsdatum :

    2005-01-01


    Format / Umfang :

    426909 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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