Smart vision system for applied image processing (Invited Paper) [3101-34]
Color line scan camera technology and machine vision: requirements to consider [3101-24]
Optical nanoscale investigation of surface characteristics (Invited Paper) [3904-47]
Multibeam Fizeau interferometer pattern localization [3904-30]
Generating random fractal fields by a double-scattering process (Invited Paper) [3904-38]
Optoelectronic hit/miss transform for real-time defect detection by moire image analysis [3101-05]
Location of target in correlated background with the SIR processor [3101-04]