Optoelectronic hit/miss transform for real-time defect detection by moire image analysis [3101-05]
Meeting; 2nd, New image processing techniques and applications: algorithms, methods, and components ; 1997 ; Munich; Germany
New image processing techniques and applications: algorithms, methods, and components ; 3101 ; 30-37
1997-01-01
8 pages
Aufsatz (Konferenz)
Englisch
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