Synonyme wurden verwendet für: atomic force microscopy
Suche ohne Synonyme: keywords:("atomic force microscopy")

51–90 von 90 Ergebnissen
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    Integrating Post-Processing Kinematic (PPK)–Structure-from-Motion (SfM) with Unmanned Aerial Vehicle (UAV) Photogrammetry and Digital Field Mapping for Structural Geological Analysis

    Freier Zugriff
    CIRILLO Daniele / Cerritelli Francesca / Agostini Silvano et al. | BASE | 2022
    Schlagwörter: structure-from-motion (SfM)

    Nanomechanical characterization and mechanical integrity of unaged and aged Li-ion battery cathodes

    Ramdon, Sanjay / Bhushan, Bharat | Tema Archiv | 2014
    Schlagwörter: Rasterkraftmikroskopie

    Repeated UAV Observations and Digital Modeling for Surface Change Detection in Ring Structure Crater Margin in Plateau

    Freier Zugriff
    Weidong Luo / Shu Gan / Xiping Yuan et al. | DOAJ | 2023
    Schlagwörter: UAV-SfM digital model

    Effect of plasma immersion ion implantation and deposition on high temperature oxidation of titanium alloy IMI 834-aluminizing

    Gurrappa, I. / Manova, D. / Gerlach, J.W. et al. | Tema Archiv | 2006
    Schlagwörter: Rasterkraftmikroskop

    Advanced Characterization of Multifunctional Nanocomposites

    Pestian, Nellie / Nepal, Dhriti | Springer Verlag | 2020
    Schlagwörter: AFM , AFM-IR

    A new mechanical-electrical approach to the wheel-rail contact

    Descartes, S. / Renouf, M. / Fillot, N. et al. | Tema Archiv | 2008
    Schlagwörter: Rasterkraftmikroskopie

    Green strength enhancement in BIIR/Olefin copolymer compounds

    Tsou, Andy H. / Duvdevani, Ilan / Datta, Sudhin | Tema Archiv | 2006
    Schlagwörter: Rasterkraftmikroskopie

    Deriving First Floor Elevations within Residential Communities Located in Galveston Using UAS Based Data

    Freier Zugriff
    Nicholas D. Diaz / Wesley E. Highfield / Samuel D. Brody et al. | DOAJ | 2022
    Schlagwörter: Structure-from-Motion (SfM)

    Rotating step by step piezomotor for nanopositioning & space applications

    Six, M.F. / Letty, R. le / Coste, P. et al. | Tema Archiv | 2006
    Schlagwörter: Atomkraftmikroskopie

    After 34,000 orbits of earth, polymers analyzed by SPM

    Kalil, C.R. | Tema Archiv | 1995
    Schlagwörter: Rasterkraftmikroskop

    MEMS for Space Flight Applications

    Lawton, R. | NTRS | 1998
    Schlagwörter: AFM infrared microscopy IR light emission microscopy LE acoustic microscopy , electron microscopy SEM focused ion beam techniques FIB atomic force microscopy

    Polymer nanocomposites for aerospace applications: characterization

    Njuguna, James / Pielichowski, Krzysztof | Tema Archiv | 2004
    Schlagwörter: Rasterkraftmikroskopie , Rasterkraftmikroskop

    Grain refinement in electrogalvanized coatings

    Martyak, Nicholas M. | Tema Archiv | 2003
    Schlagwörter: Atomkraftmikroskopie

    The use of natural rubber latex as a renewable and sustainable modifier of asphalt binder

    Wen, Yong | Online Contents | 2017
    Schlagwörter: atomic force microscope (AFM)

    Microscopic investigation of surface layers on rails

    Jiraskova, Y. / Svoboda, J. / Schneeweiss, O. et al. | Tema Archiv | 2005
    Schlagwörter: Atomkraftmikroskopie

    Effect of low earth orbit atomic oxygen exposure on phenylphosphine oxide-containing polymers

    Connell, J.W. | Tema Archiv | 1999
    Schlagwörter: Atomkraftmikroskopie

    Modeling and Surface Modification of AISI 321 Stainless Steel by Nanosecond Laser Radiation

    Dobrotvorskiy, Sergey / Aleksenko, Borys A. / Kościński, Mikołaj et al. | Springer Verlag | 2023
    Schlagwörter: AFM

    Identification and Validation of an Engine Performance Database Model for the Flight Management System

    Ghazi, Georges / Botez, Ruxandra Mihaela | AIAA | 2019
    Schlagwörter: AFM

    Metal-metal friction characteristics and gear pitting life performance of metal V-belt type CVTFs

    Narita, Keiichi | Tema Archiv | 2012
    Schlagwörter: Atomkraftmikroskopie

    Mechanisms based on piezo actuators

    Claeyssen, F. / Le Letty, R. / Barillot, F. et al. | Tema Archiv | 2001
    Schlagwörter: Atomkraftmikroskopie

    Experimental Investigation on Tensile and Fracture Behaviour of Glass Fibre-Reinforced Nanoclay/Mg–Al LDH-Based Fibre Metal Laminates

    Logesh, K. / Bupesh Raja, V. K. / Venkatasudhahar, M. et al. | Springer Verlag | 2018
    Schlagwörter: Atomic force microscope (AFM)

    Micromechanical Surface Investigation of Bio-modified RAP Binder

    Cavalli, Maria Chiara / Poulikakos, Lily D. | Springer Verlag | 2019
    Schlagwörter: AFM

    Non-silicone inorganic polymers based coatings for atomic oxygen protection in LEO

    Poire, E. / Sellars, B.G. / Nguyen, D. | Tema Archiv | 1998
    Schlagwörter: Atomkraftmikroskopie

    Aluminum oxynitride coatings for oxidation resistance of epoxy films

    Ianno, N.J. / Enshashy, H. / Dillon, R.O. | Tema Archiv | 2002
    Schlagwörter: Atomkraftmikroskopie

    A study of atomic oxygen interactions with protected silver surfaces

    Gouzman, I. / Grossman, E. / Murat, M. et al. | Tema Archiv | 2003
    Schlagwörter: Atomkraftmikroskopie

    Anti-fouling silicone elastomers for offshore structures

    Weinell, Claus E. / Marsh, Nicholas / Roll, Jan | Tema Archiv | 2006
    Schlagwörter: Rasterkraftmikroskopie

    AFM Analysis of 3D Printing PEI for Automotive Applications

    Nguyen, Khanh Q. / Vuillaume, Pascal Y. / Robert, Mathieu et al. | Springer Verlag | 2023
    Schlagwörter: Atomic force microscope (AFM) analysis

    Intelligent fast 3D - surface quality control and applications in the automotive industry

    Leopold, J. / Günther, H. / Fürderer, K. et al. | Tema Archiv | 2000
    Schlagwörter: Atomkraftmikroskopie

    Diagnostic characterization of high power lithium-ion batteries for use in hybrid electric vehicles

    Zhang, X. / Ross, P.N. / Kostecki, R. et al. | Tema Archiv | 2001
    Schlagwörter: Atomkraftmikroskopie

    Nanomaterials for space power

    Raffaelle, Ryne P. / Landi, Brian J. / Cress, Cory et al. | Tema Archiv | 2007
    Schlagwörter: Rasterkraftmikroskopie

    Oxidationsverfahren für Leichtmetallwerkstoffe - Anwendungen für die Raumfahrt

    Bayer, U. | Tema Archiv | 1999
    Schlagwörter: Atomkraftmikroskopie

    Atomic oxygen resistant inorganic materials for LEO applications

    Poire, E. / Lachance, J. | Tema Archiv | 1999
    Schlagwörter: Atomkraftmikroskopie

    Methods for Determining the Level of Autonomy to Design into a Human Spaceflight Vehicle: A Function Specific Approach

    Proud, Ryan W. / Hart, Jeremy J. / Mrozinski, Richard B. | NTRS | 2003
    Schlagwörter: AFM (AUTONOMOUS FLIGHT MANAGEMENT)

    The effects of cyclic thermal loading on n-type 4H-SiC device components for EM-gun pulsers

    Cole, M.W. / Hubbard, C. / Demaree, D. et al. | Tema Archiv | 1998
    Schlagwörter: Atomkraftmikroskopie

    Methods for Determining the Level of Autonomy to Design into a Human Spaceflight Vehicle: A Function Specific Approach

    R. W. Proud / J. J. Hart / R. B. Mrozinski | NTIS | 2003
    Schlagwörter: Afm(Autonomous flight management)