31–40 von 72 Ergebnissen
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    Effect of bonding temperature on the precipitation of delta phase in diffusion bonded Inconel 718 joints

    Zhang, Guoge / Chandel, Roop Singh / Pheow, Seow Hong et al. | Tema Archiv | 2006
    Schlagwörter: TEM (Transmissionselektronenmikroskop)

    Neue Meßzellen-Familie

    Hansen, D. / Ristau, D. | Tema Archiv | 1998
    Schlagwörter: TEM-Mode

    Microscopic investigation of surface layers on rails

    Jiraskova, Y. / Svoboda, J. / Schneeweiss, O. et al. | Tema Archiv | 2005
    Schlagwörter: Transmissionselektronenmikroskopie

    Compact leaky SIW feeder offering TEM parallel plate waveguide launching

    Freier Zugriff
    Gómez-Guillamón Buendía, Victoria / Podilchak, Symon K. / Comite, Davide et al. | BASE | 2019
    Schlagwörter: TEM mode

    Nb-base FS-85 alloy as a candidate structural material for space reactor applications: Effects of thermal aging

    Leonhard, Keith J. / Busby, Jeremy T. / Hoelzer, David T. et al. | Tema Archiv | 2009
    Schlagwörter: Transmissionselektronenmikroskopie

    Stability of the microstructure and microhardness of a cast TiAl-based intermetallic alloy for turbine blades

    Lapin, J. / Pelachova, T. | Tema Archiv | 2004
    Schlagwörter: Transmissionselektronenmikroskopie

    Microscopy study of intergranular stress corrosion cracking of X-52 line pipe steel

    Elboujdaini, M. / Li, J. / Fang, B. et al. | Tema Archiv | 2006
    Schlagwörter: Transmissionselektronenmikroskopie

    A complete methodology for assessing GaN behaviour for military applications

    Moreau, C. / Le Pipec, M. / Tence, S. et al. | Tema Archiv | 2010
    Schlagwörter: Transmissionselektronenmikroskopie

    Effect of line pipe steel microstructure on susceptibility to sulfide stress cracking

    Koh, S.U. / Kim, J.S. / Yang, B.Y. et al. | Tema Archiv | 2004
    Schlagwörter: Transmissionselektronenmikroskopie

    Effect of interfacial reaction layer on bond strength of friction- bonded joint of Al alloys to steel

    Ikeuchi, Kenji / Yamamoto, Naotsugu / Tkahashi, Makoto et al. | Tema Archiv | 2005
    Schlagwörter: TEM (Transmissionselektronenmikroskopie)