Applications of x-ray intensity interferometry [4782-16]
EUV multilayer mirrors with tailored spectral reflectivity [4782-26]
Heat stability of Mo/Si multilayers inserted with silicon oxide layers [4782-37]
Highly reflective uranium mirrors for astrophysics applications [4782-29]
Microstructure of Mo/Si multilayers with barrier layers [4782-25]
New process for x-ray mirror image quality improvement [4782-06]