Zuverlaessigkeit am Beispiel der Flugzeugelektronik
Ueber die Alterung von Silizium-Leistungstromrichtern
The VMOS power device - A direct interface between microprocessors
The past, present and future of EEE components for space application; COTS-the next generation
The effects of cyclic thermal loading on n-type 4H-SiC device components for EM-gun pulsers
The easy way to get aerospace quality semiconductors
Technologies and reliability of modern embedded flash cells
Strain depending reliability of automotive diodes