1–12 von 12 Ergebnissen
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    Nanotechnology's impact on aircraft design and maintenance

    Kirkland, L.V. / Wright, R.G. | IEEE | 2003

    Using neural networks to solve testing problems

    Kirkland, L.V. / Wright, R.G. | IEEE | 1997

    Test program run time in today's ATE environment

    Hernandez, J.L. / Wright, R.G. | Tema Archiv | 1983

    Failure diagnosis of integrated circuits using ir laser images

    Keenan, E. / Wright, R.G. / Kirkland, L.V. | IEEE | 2003

    Nanotechnology-based molecular test equipment (MTE)

    Wright, R.G. / Zgol, M. / Keeton, S. et al. | IEEE | 2001

    Terahertz and laser imaging for printed circuit board failure detection

    Keenan, E. / Wright, R.G. / Mulligan, R. et al. | Tema Archiv | 2004

    IR circuit board and IC failure detection

    Keenan, E. / Wright, R.G. / Zgol, M. et al. | IEEE | 2004

    Intelligent test program evaluation

    Wright, R.G. / Dudey, Y. / Bowers, H. et al. | Tema Archiv | 1990

    Maintenance data mining and visualization for fault trend analysis

    Wright, R.G. / Kirkland, L.V. / Cicchiani, J. et al. | Tema Archiv | 2001

    Nanotechnology's Impact on Aircraft Design & Maintenance

    Kirkland, L.V. | Online Contents | 2003
    Beteiligte: Wright, R.G.

    IR Circuit Board and IC Failure Detection

    Keenan, E. | Online Contents | 2004
    Beteiligte: Wright, R.G.