This paper has examined four main areas in consideration of efficient ATE test run times. It was determined that, even though many advances have taken place with regard to both ATE hardware and software, these advances have not translated into faster ATE test run times. Issues were discussed and suggestions were given with regard to testing philosophy and test program efficiency to aid in achieving efficient ATE test program run times. Future trends in ATE will impose additional demands on ATE system hardware and software. These demands must be accommodated without sacrificing the primary goal of ATE: fast and efficient testing of UUTs.


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    Titel :

    Test program run time in today's ATE environment


    Weitere Titelangaben:

    Laufzeit von Pruefprogrammen bei heutigen automatisierten Pruefeinrichtungen


    Beteiligte:
    Hernandez, J.L. (Autor:in) / Wright, R.G. (Autor:in)


    Erscheinungsdatum :

    1983


    Format / Umfang :

    6 Seiten, 2 Bilder, 2 Quellen


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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