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    Lifetime modeling and simulation of power modules for hybrid electrical/electrical vehicles

    Thoben, M. / Sauerland, F. / Mainka, K. et al. | Tema Archiv | 2014

    UV LEDs reliability tests for fluoro-sensing sensor application

    Arques-Orobon, F.J. / Nunez, N. / Vazquez, M. et al. | Tema Archiv | 2014

    How supercapacitors reach end of life criteria during calendar life and power cycling tests

    Chaari, R. / Briat, O. / Deletage, J.Y. et al. | Tema Archiv | 2011

    Analysis of ultracapacitors ageing in automotive application

    Catelani, M. / Ciani, L. / Marracci, M. et al. | Tema Archiv | 2013

    Optimization of wire connections design for power electronics

    Celnikier, Y. / Dupont, L. / Herve, E. et al. | Tema Archiv | 2011

    Semiconductors in high temperature applications - a future trend in automotive industry

    Goroll, M. / Pufall, R. / Kanert, W. et al. | Tema Archiv | 2004

    Reliability aspects of semiconductor devices in high temperature applications

    Kanert, W. / Dettmer, H. / Plikat, B. et al. | Tema Archiv | 2003

    Reliability of MEMS - a methodical approach

    Muller-Fiedler, R. / Wagner, U. / Bernhard, W. | Tema Archiv | 2002

    Reliable power electronics for automotive applications

    Seliger, N. / Wolfgang, E. / Lefranc, G. et al. | Tema Archiv | 2002

    An assessment of the value of added screening of electronic components for commercial aerospace applications

    Hester, K.D. / Koehler, M.P. / Kanciak-Chwialkowski, H. et al. | Tema Archiv | 2001

    Long term reliability testing of HV-IGBT modules in worst case traction operation

    Fratelli, L. / Cascone, B. / Giannini, G. et al. | Tema Archiv | 1999