Due to the increasing importance of the power electronic devices in industrial applications, it becomes necessary to consider the reliability and predict the life of the components. This paper initially discusses the general reliability prediction methods for power converters. In a converter, the life of the power electronic devices depends on the failure rate of the individual device. For the evaluation of failure rate of power semiconductor device temperature, current rating, voltage stress, application, quality and environment factors are considered. Life period of the device is decided by the bathtub curve. All the quantitative analysis projected in this work are based on the standard of MIL‐217F N2.


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    Titel :

    Reliability Approach for the Power Semiconductor Devices in EV Applications


    Beteiligte:
    Chitra, A. (Herausgeber:in) / Sanjeevikumar, P. (Herausgeber:in) / Holm‐Nielsen, Jens Bo (Herausgeber:in) / Himavathi, S. (Herausgeber:in) / Krishnachaitanya, D. (Autor:in) / Chitra, A. (Autor:in) / Biswas, S.S. (Autor:in)


    Erscheinungsdatum :

    2020-07-15


    Format / Umfang :

    10 pages




    Medientyp :

    Aufsatz/Kapitel (Buch)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch