Metallized Teflon fluorinated ethylene propylene (FEP) thermal control insulation is mechanically degraded if exposed to a sufficient fluence of soft x-ray radiation. Soft x-ray photons (4-8 angstrom in wavelength or 1.55 - 3.2 keV) emitted during solar flares have been proposed as a cause of mechanical properties degradation of aluminized Teflon FEP thermal control insulation on the Hubble Space Telescope (HST). Such degradation can be characterized by a reduction in elongation-to-failure of the Teflon FEP. Ground laboratory soft x-ray exposure tests of aluminized Teflon FEP were conducted to assess the degree of elongation degradation which would occur as a result of exposure to soft x-rays in the range of 3-10 keV. Tests results indicate that soft x-ray exposure in the 3-10 keV range, at mission fluence levels, does not alone cause the observed reduction in elongation of flight retrieved samples. The soft x-ray exposure facility design, mechanical properties degradation results and implications will be presented.


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    Titel :

    Ground laboratory soft x-ray durability evaluation of aluminized teflon FEP thermal control insulation


    Beteiligte:
    Banks, B.A. (Autor:in) / Groh, K.K. de (Autor:in) / Stueber, T.J. (Autor:in) / Sechkar, E.A. (Autor:in)


    Erscheinungsdatum :

    1998


    Format / Umfang :

    11 Seiten, 8 Quellen


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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