The authors discuss a method called projection pursuit, which can compress dimensions of feature space. They define a projection index which is suitable for practical use and derive a way to obtain the optimum projecting matrix, i.e. one that maximizes the projection index. The results obtained can be used to project multifeature patterns can be projected to one-dimensional or two-dimensional space, and they will be more easily recognized.


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    Titel :

    A pattern recognition method using projection pursuit


    Weitere Titelangaben:

    Eine Mustererkennungsmethode unter Anwendung von Projektion


    Beteiligte:
    Liu, B. (Autor:in) / Shen, Z. (Autor:in) / Sun, Z. (Autor:in)


    Erscheinungsdatum :

    1990


    Format / Umfang :

    3 Seiten, 4 Quellen


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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