Monolithic Analog-to-Digital Converters (ADCs) exhibit a large error rate in the single event effects (SEE) environment. Analysis of data from a high-performance ADC demonstrates the type of errors and their potential impact on system performance. While SEEs in memory devices have been well characterized, the system impact of SEE in other complex electronic devices is not effectively characterized. This effort demonstrates that high-performance ADCs, which are used extensively in modern satellite systems, do indeed have a substantial SEE-induced error rate and that the error rate can be effectively characterized using reasonably simple modifications to well-known error rate calculations as used for memory devices.
Single event effects in analog-to-digital converters: device performance and system impact
Einzelereigniseffekte bei A/D-Konvertern: Geräteperformance und Systemauswirkung
1994
8 Seiten, 8 Bilder, 4 Tabellen, 5 Quellen
Aufsatz (Konferenz)
Englisch
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