Fiber optic networks have long been touted for their high bandwidth and excellent noise immunity. However, efforts to introduce photonic networks into avionic systems have been less than successful due to design, reliability, and maintainability problems. Many of these problems have been traced to particulate contaminations and failure under severe environmental conditions. Since the F-22, RAH-66, and several commercial aircraft are planning to use photonic networks, there has been considerable effort underway to develop more reliable optical connectors and components. AT&T, under contract to the Avionics Directorate at Wright-Patterson AFB, has developed a new type of connector that employs expanded-beam optics and micro-machined silicon alignment blocks to maintain extremely accurate alignment, even under severe shock and vibration. This connector also provides self-sealing doors that protect the unmated connectors from sand, dust, and abusive handling. The design and test results for this connector are presented in this paper.


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    Titel :

    The reliable optical card-edge connector (ROC)


    Weitere Titelangaben:

    Ein zuverlässiger Lichtleiterkoppler (ROC-Typ)


    Beteiligte:
    Benning, S.L. (Autor:in) / Pimpinella, R.J. (Autor:in) / Seals, D.J. (Autor:in)


    Erscheinungsdatum :

    1993


    Format / Umfang :

    5 Seiten, 8 Bilder, 2 Tabellen, 3 Quellen



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    The Reliable Optical Card-Edge Connector (ROC)

    Benning, S. / Pimpinella, R. J. / Seals, J. D. et al. | British Library Conference Proceedings | 1993


    Single-Mode Reliable Optical Card-Edge Connector (SROC)

    Benning, S. / IEEE / AIAA | British Library Conference Proceedings | 1994


    Reliable optical card-edge (ROC) connector for avionics applications

    Darden, Bruce V. / Pimpinella, Richard J. / Seals, John D. | SPIE | 1994


    Card edge connector

    NISHIO AKIHIRO / TABATA MASAAKI / MORIYASU MASANORI et al. | Europäisches Patentamt | 2015

    Freier Zugriff