Suitability of low on-resistance trench MOSFETs has been considered for start-stop applications that require paralleling of several MOSFETs and require them to undergo millions of high current repetitive avalanche stress. Factors affecting current sharing in avalanche are discussed and are used to arrive at worst case for current imbalance which would result in one MOSFET carrying majority of the total current. These conditions are used in extended repetitive avalanche characterization of the MOSFETs to measure the extent of degradation over their lifetime. High current repetitive avalanche stress resulted in shifts in electrical parameters and their effect on reliability of the MOSFET is discussed. This work also applies to other high current applications where MOSFETs are required to be paralleled and where they undergo repetitive avalanche stress for extended times.
MOSFETs for start-stop system in micro hybrid automobiles
2011
7 Seiten, 10 Bilder, 2 Tabellen, 6 Quellen
(nicht paginiert)
Aufsatz (Konferenz)
Datenträger
Englisch
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