Previous articles in this journal have shown that x-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) can be useful surface analysis tools for characterizing materials and coatings. XPS is excellent for accurately determining the composition and chemical state of elements, while AES excels in measuring the integrity of conversion layers used to impede corrosion on metal substrates under coatings. The great flexibility of ToF-SIMS (time-of-flight secondary ion mass spectrometry) completes this suite of surface analysis techniques. ToF-SIMS complements XPS and AES with the ability to yield molecular information with high sensitivity at high spatial resolution. The rich structural information provided by SIMS is unique in a surface analysis technique, and the wide variety of experiments that are available make SIMS the ideal analysis method for studying a variety of coatings issues. In automotive paint systems the technique can serve as a problem-solving tool to elucidate the presence of contaminants, while at the same time serve as a premier research tool that can measure and quantify the migration of additives. Its ability to measure isotopes allows the analyst to perform interesting and powerful labeling experiments that can predict the longevity of coating systems. In the future, ToF-SIMS will serve well as an analysis tool and as a predictive tool to help design and formulate the next generation of coatings for a wide variety of industries and applications.


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    Titel :

    Analytical series: Secondary ion mass spectrometry of automotive coating systems


    Beteiligte:

    Erschienen in:

    Coatings Tech ; 8 , 7 ; 34-43


    Erscheinungsdatum :

    2011


    Format / Umfang :

    10 Seiten, 16 Bilder, 1 Tabelle, 20 Quellen



    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Print


    Sprache :

    Englisch




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