It is dealt with the reliability assessment of low voltage super-junction MOSFETs for motor control applications in the automotive field. Thermo-mechanical stresses generated on the source metallization have been recognized as one important mechanism of ageing in these applications and the cause of a high rate of premature failures. Therefore, the effects of short-circuit conditions and repetitive avalanche operations on the lifetime are investigated using an experimental thermodynamic analysis of the temperature evolution over the source metallization. A comparison in terms of expected lifetime under short circuit and repeated avalanche operations with traditional Gate Trench MOSFETS having similar characteristics is finally accomplished.


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    Titel :

    Lifetime estimation of super-junction power MOSFETs under short circuit and repeated avalanche operations


    Weitere Titelangaben:

    Schätzungen zur Lebensdauer von Super-Übergangs-MOSFETs unter Kurzschluss- und wiederholtem Lawinenbetrieb


    Beteiligte:
    Testa, Antonio (Autor:in) / Caro, Salvatore De (Autor:in) / Patane, Salvatore (Autor:in) / Panarello, Saverio (Autor:in) / Patti, Davide (Autor:in) / Russo, Sebastiano (Autor:in) / Letor, Romeo (Autor:in)


    Erscheinungsdatum :

    2010


    Format / Umfang :

    6 Seiten, 13 Bilder, 1 Tabelle, 4 Quellen


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Datenträger


    Sprache :

    Englisch




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