It is dealt with the reliability assessment of low voltage super-junction MOSFETs for motor control applications in the automotive field. Thermo-mechanical stresses generated on the source metallization have been recognized as one important mechanism of ageing in these applications and the cause of a high rate of premature failures. Therefore, the effects of short-circuit conditions and repetitive avalanche operations on the lifetime are investigated using an experimental thermodynamic analysis of the temperature evolution over the source metallization. A comparison in terms of expected lifetime under short circuit and repeated avalanche operations with traditional Gate Trench MOSFETS having similar characteristics is finally accomplished.
Lifetime estimation of super-junction power MOSFETs under short circuit and repeated avalanche operations
Schätzungen zur Lebensdauer von Super-Übergangs-MOSFETs unter Kurzschluss- und wiederholtem Lawinenbetrieb
2010
6 Seiten, 13 Bilder, 1 Tabelle, 4 Quellen
Aufsatz (Konferenz)
Datenträger
Englisch
FMEA and lifetime estimation of power MOSFETs for brake systems
Tema Archiv | 2009
|Analysis of avalanche behaviour for paralled MOSFETs
Kraftfahrwesen | 2004
|Coole MOSFETs Vorteile von Super-junction- und konventionellen Hochvolt-Bauelementen vereint
British Library Online Contents | 2009