In this paper, circuit failure prediction by timing degradation is used to monitor semiconductor aging, which is a safety-critical problem in the automotive market. Reliability and variability issues are worsening with device scaling down. For safe operation, we propose on-chip, on-line aging monitoring. A novel aging sensor (to be selectively inserted in key locations in the design and to be activated from time to time) is proposed. The aging sensor is a programmable delay sensor, allowing decision-making for several degrees of severity in the aging process. It detects abnormal delays, regardless of their origin. Hence, it can uncover "normal" aging (namely, due to NBTI) and delay faults due to physical defects activated by long circuit operation. The proposed aging sensor has been optimized to exhibit low sensitivity to PVT (Process, power supply Voltage and Temperature) variations. Moreover, the area overhead of the new architecture is significantly less than the one of other aging sensors presented in the literature. Simulation results with a 65 nm sensor design are presented, ascertaining its usefulness and its low sensitivity, in particular to process variations.


    Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Low-sensitivity to Process Variations Aging Sensor for Automotive Safety-Critical Applications


    Beteiligte:
    Vazquez, J.C. (Autor:in) / Champac, V. (Autor:in) / Ziesemer, A.M. (Autor:in) / Reis, R. (Autor:in) / Teixeira, I.C. (Autor:in) / Santos, M.B. (Autor:in) / Teixeira, J.P. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    2010


    Format / Umfang :

    6 Seiten, 25 Quellen




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Programmable Aging Sensor for Automotive Safety-Critical Applications

    Vazquez, J.C. / Champac, V. / Teixeira, I.C. et al. | Tema Archiv | 2010



    CARS 2016 - Critical Automotive applications: Robustness & Safety CARS2016

    International Workshop on Critical Automotive applications: Robustness & Safety | TIBKAT | 2016

    Freier Zugriff

    An Adaptable Software Safety Process for Automotive Safety-Critical Systems

    Czerny, Barbara J. / Murray, Brian T. / D'Ambrosio, Joseph G. et al. | SAE Technical Papers | 2004


    An adaptable software safety process for automotive safety-critical systems

    Czerny,B.J. / D'Ambrosio,J.G. / Jacob,P.O. et al. | Kraftfahrwesen | 2004