The automotive environment is challenging in terms of temperature loads, humidity and vibration impacts. The zero failure goal in automotive industry demands for an integrated approach considering robust designs, technology qualification, and improved production control. Currently components for automotive use are qualified with standardized tests, e.g. according to AEC Q100 or Q101 in case of active semiconductors. In order to derive the required qualification conditions and test times, it is necessary to determine the relevant stresses. In the paper, the author discusses the thermal impacts on electronic modules attached to the transmission of a car. It is concluded, that more sophisticated qualification procedures are required, since technology and device qualification is an increasingly time consuming procedure.


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    Titel :

    Accelerated lifetime testing of automotive electronics


    Weitere Titelangaben:

    Beschleunigte Lebensdauerprüfung für Kraftfahrzeugelektronik


    Beteiligte:
    Wondrak, W. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    2009


    Format / Umfang :

    4 Seiten, 9 Bilder, 2 Tabellen, 2 Quellen



    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Print


    Sprache :

    Englisch




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    Accelerated Mode Test for automotive electronics

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    Accelerated Mode Test for Automotive Electronics

    Culbertson, Gary | SAE Technical Papers | 1996