An increasing number of tantalum capacitors are specified for HT applications as required by the automobile. This challenge is addressed by several modifications in the manufacturing process. For further improvement, it is important to check the reliability of such devices by the combination of simulations and lifetime tests. Therefore systematic investigations under different stress voltages and temperatures were performed. Components from the same type but with different capacitance value could show a stable steady state behaviour or not. This can be explained by different dielectric layer thickness. Addressing temperatures up to 175 deg C is a reachable goal with appropriate derating and material selection. Thermo-mechanical stresses studies for mounted devices are possible by determining the adequate parameters, which will allow lifetime modelling.


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    Titel :

    Reliability analysis testing of tantalum capacitors for HT applicaitons


    Weitere Titelangaben:

    Zuverlässigkeitsprüfung von Tantalkondensatoren für Hochtemperaturanwendungen


    Beteiligte:
    Dehbi, A. (Autor:in) / Wondrak, W. (Autor:in) / Ousten, Y. (Autor:in) / Danto, Y. (Autor:in)


    Erscheinungsdatum :

    2002


    Format / Umfang :

    6 Seiten, 15 Bilder, 5 Tabellen, 3 Quellen


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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