This paper presents experimental results from degradation induced by electron, proton and by 60.Co in a COTS optocoupler. The radiation degradation of the CTR has been investigated for proton energies from 21 MeV to 200 MeV and for 6 MeV and 9 MeV electrons. In a previously work the authors have have concluded that the total degradation of the optocoupler is caused by emission loss of the LED, that is, a displacement damage effect in GaAs. The displacement damage dose is then calculated and is shown not to depend on the energy. The authors also prove that the displacement damage dose is independent on the particle type (electron or proton). From ground testing point of view, it should be possible to reproduce the mission degradation by irradiating the device with any couple (Fluence, Energy) that produces the same displacement damage dose. In analogy to the calculation of ionising dose, the displacement damage is determining both for protons and electrons by integrating the product of the differential energy spectrum at the point interest and the NIEL. Finally it is possible to evaluate the mission degradation with only one proton (or electron) irradiation produces the CTR degradation. It's important to note that this study is focus on a particular optocoupler. To use this prediction method all key points of this paper must be verified to study permanent degradations in an another device.
Correlation between electron and proton induced permanent degradation in a COTS optocoupler
Korrelation zwischen der durch Elektronen und Protonen induzierten permanenten Degradation in einem COTS-Optokoppler
2002
4 Seiten, 4 Bilder, 1 Tabelle, 18 Quellen
Aufsatz (Konferenz)
Englisch
Correlation between electron and proton induced permanent degradation in a COTS optocoupler
British Library Conference Proceedings | 2002
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