Instrumentation for high-precision in-flight focusing of on-board optoelectronic equipment is described. The first part of the paper gives an overview of the existing focusing techniques and describes their application for particular remote sensing task solutions. A comparison of different methods is made, the accuracy provided by each method is assessed and one of the best techniques-a contrast method-is considered. This method is shown to provide high precision-5 mu m or better. The second part describes a mathematical model of instrumentation using this method. It includes a diffraction modulation transfer function (MTF), an MTF related to optical system aberrations and an optical system defocusing MTF. The simulation results are shown and respective recommendations are given.


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    Titel :

    Instrumentation for obtaining best-image surface in remote-sensing optoelectronic systems


    Beteiligte:
    Baklanov, A.I. (Autor:in) / Zabiyakin, A.S. (Autor:in) / Klushnikov, M.V. (Autor:in)


    Erscheinungsdatum :

    1999


    Format / Umfang :

    6 Seiten, 8 Quellen




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch