A substrate bias compensation circuit is described which monitors the threshold voltage of a sample FET circuit on an integrated circuit chip and modifies the substrate voltage for a chip to compensate for variations in the monitor threshold voltage due to radiation damage such as might occur in a space satellite exposed to a solar flare.
Dynamic substrate bias to achieve radiation hardening
Dynamische Substratvorspannung zur Erzielung von Strahlungshaerte
IBM Technical Disclosure Bulletin ; 25 , 11A ; 5829-5830
1983
2 Seiten
Aufsatz (Zeitschrift)
Englisch
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