Single-event upsets reduced by use of oversize transistors. Computers made less susceptible to ionizing radiation by replacing bipolar integrated circuits with properly designed, complementary metaloxide-semiconductor (CMOS) circuits. CMOS circuit chips made highly resistant to single-event upset (SEU), especially when certain feedback resistors are incorporated. Redesigned chips also consume less power than original chips.
Radiation Hardening of Computers
NASA Tech Briefs ; 10 , 3
1986-05-01
Sonstige
Keine Angabe
Englisch
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