V. L. Linden; C. R. Waldo: A New Approach to the Development of Diagnostic Systems (1160-1163). --J. J. Holden, III; D. H. McCallem: Architectural Concepts of A Fault Isolation System (1164-1169). --C. J. Tavora; H. M. Collins: A Storage Device for Subsystem Maintenance Information (1170-1174). --G. Schopf; S. Baily: USAF Avionic Interface Standardization - The Next Steps (1175-1181). --S. Bryant: Characterization of Fault Propagation as A Simple Markov Process (1182-1188).
IEEE 1981 National Aerospace and Electronics Conf., NAECON 1981, Proc.; May 19-21, 1981; Dayton, USA; (Fault isolation)
Berichtsband der NAECON 1981 (Fehlerabgrenzung)
1981
29 Seiten
Aufsatz (Konferenz)
Englisch