In our paper we have analyzed the application possibility of a modified version of speckle pattern interferometry: the adaptive speckle pattern interferometry (ASPI). The peculiarity of this technique is that reference waves are produced by holographically reconstructed virtual images. Using this course an adaptive measuring system can be built. A realization of the ASPI is presented as a measuring device for various measuring tasks. Selected applications are shown from real time holography to comparative displacement measurement.
Adaptive speckle pattern interferometry
Optical Engineering for Sensing and Nanotechnology (ICOSN '99) ; 1999 ; Yokohama,Japan
Proc. SPIE ; 3740
1999-05-07
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
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