Silicon pore optic (SPO) mirror modules (MMs) are being developed and produced for ESA’s ATHENA mission. The optics have, and will be, tested at MPEs PANTER x-ray test facility. We present the results obtained from tests performed at the PANTER x-ray test facility for the SPO MM-0050 that was produced to verify the latest optical performance (half energy width (HEW), effective area) of SPOs, supporting the ESA reviews of their optical performance.

    The preparations are ongoing at PANTER, ESA, cosine and Media Lario to perform complex opto-thermo-mechanical tests of the two full scale 1/6th sectors of the final ATHENA mirror assembly structure produced by the potential ATHENA primes Airbus Defence and Space and Thales Alenia Space. For these tests a set of three SPO MMs have been produced following the flight configuration. The MMs will be incorporated into the full scale 1/6th sectors to measure the impact of thermal gradients on the thermoelastic deformation of the structure and therefore the HEW performance. A description of the tests is presented here.

    PANTER is also involved in the development, testing, and fabrication of the mirror adapter structure (MAS) to support the 2.6-m diameter ATHENA mirror assembly module demonstrators (MAMD) during the planned x-ray tests at XRCF. A description of the PANTER tests and results will be presented in this paper together with a short overview of the MAS MGSE for XRCF.


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    Titel :

    X-ray testing ATHENA optics at PANTER


    Beteiligte:
    Burwitz, Vadim (Autor:in) / Vacanti, Giuseppe (Autor:in) / Collon, Maximilien J. (Autor:in) / Barrière, Nicolas (Autor:in) / Bavdaz, Marcos (Autor:in) / Ferreira, Ivo (Autor:in) / Ayre, Mark (Autor:in) / Tipper, Emily (Autor:in) / Eder, Josef (Autor:in) / Breunig, Elias (Autor:in)

    Kongress:

    Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray ; 2022 ; Montréal,Québec,Canada


    Erschienen in:

    Proc. SPIE ; 12181


    Erscheinungsdatum :

    31.08.2022





    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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