This paper describes an experimental technique to relate IC conduced emission, as measured by the 1 method (IEC 61967-4), and conducted emission measured by the ground plane method, as described in the CISPR 25 standard. In particular, the maximum limit of IC power supply current spectrum is derived on the basis of emission limits specified in the CISPR 25 document. Such information is useful when defining EMC specifications at IC level.


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    Titel :

    Identification of Integrated Circuits Conducted Emission Limits for Automotive Applications


    Weitere Titelangaben:

    Sae Technical Papers


    Beteiligte:
    Fiori, F. (Autor:in) / Musolino, F. (Autor:in) / Schinco, F. (Autor:in) / De La Pierre, P. (Autor:in)

    Kongress:

    SAE 2005 World Congress & Exhibition ; 2005



    Erscheinungsdatum :

    2005-04-11




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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