Statistical Process Control (SPC) methods were used to troubleshoot the process problems that occur in the manufacturing of elastomeric shot bushes. This developed procedure helped to identify the variables responsible for the process going out of control and demonstrated that, given the existing engineering tolerances, even when the process is in control, it would still not be capable.When it was determined that the manufacturing process was not in control, SPC techniques were implemented to investigate the causes and effects and to bring the process back in control. Ultimately, the process was shown to be significantly improved and very close to capable by adjusting the engineering tolerances. This paper will demonstrate how SPC techniques identified the problems, tracked trends in the manufacturing process, and alleviated future process problems. The intent of this paper is not to train people in SPC, but to show how SPC was used as a decision making tool for a real world problem.


    Zugriff

    Zugriff prüfen

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Using Statistical Process Control to Troubleshoot and Track Trends in Manufacturing Elastomeric Shot Bushes


    Weitere Titelangaben:

    Sae Technical Papers


    Beteiligte:

    Kongress:

    International Off-Highway & Powerplant Congress & Exposition ; 1996



    Erscheinungsdatum :

    01.08.1996




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Resilient bushes

    Engineering Index Backfile | 1939


    Suspension bushes under test

    Narraway, R. | Tema Archiv | 1997


    OILES on bearings and bushes

    Online Contents | 2006


    ELASTOMERIC ENDLESS TRACK AND METHOD FOR MANUFACTURING SAME

    HALSTEAD ERIC / CHAMPAGNE OLIVIER | Europäisches Patentamt | 2023

    Freier Zugriff

    ELASTOMERIC ENDLESS TRACK AND METHOD FOR MANUFACTURING SAME

    HALSTEAD ERIC / CHAMPAGNE OLIVIER | Europäisches Patentamt | 2025

    Freier Zugriff