The purpose of the Los Alamos High-Energy Neutron Testing Handbook is to provide user information and guidelines for testing Integrated Circuits (IC) and electronic systems at the Irradiation of Chips and Electronics (ICE) Houses at the Los Alamos Neutron Science Center (LANSCE) at Los Alamos National Laboratory (LANL). Microelectronic technology is constantly advancing to higher density, faster devices and lower voltages. These factors may increase device susceptibility to radiation effects. The high-energy neutron source at LANSCE/LANL provides the capability for accelerated neutron testing of semiconductor devices and electronic systems and to simulate effects in various neutron environments.
Los Alamos High-Energy Neutron Testing Handbook
Sae Int. J. Adv. and Curr. Prac. in Mobility
AeroTech ; 2020
Sae International Journal of Advances and Current Practices in Mobility ; 2 , 3 ; 1279-1302
2020-03-10
24 pages
Aufsatz (Konferenz)
Englisch
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