The rapidly expanding use of modal analysis techniques creates a need for testing systems which can make the required measurements more efficiently and more accurately than in the past. This paper discusses the design criteria and architecture for a multi-channel FFT processor, and shows how processing up to sixteen parallel input signals can reduce measurement time by an order of magnitude. An example is given which shows the practical value of this increased efficiency.


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    Titel :

    Multi-Channel Modal Testing


    Weitere Titelangaben:

    Sae Technical Papers


    Beteiligte:
    Durham, David J. (Autor:in) / Deel, James C. (Autor:in)

    Kongress:

    SAE International Congress and Exposition ; 1982



    Erscheinungsdatum :

    1982-02-01




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch


    Schlagwörter :


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