This paper describes a Virtual Validation Cloud (V₂Cloud), a new computation platform designed for extensive failure mode and effect analysis (FMEA) of an automotive electronic control system. Recently, automotive developers have been requested to execute enormous amounts of system-level tests in order to assure functional safety of electric control systems. Moreover, the upcoming industry standard, ISO26262, demands that system-level validation assures extensive sets of test vectors and clarifies results of the tests as evidence of functional safety. It is unrealistic to execute these system-level tests by only using conventional hardware-in-the-loop simulation (HILS).Virtual HILS (VHILS), a system-level validation environment for automotive systems based on co-simulation of software and mechatronics, has already been proposed. Virtualizing an automotive electronic control system makes its testing environment more software-centric and independent of actual hardware. The VHILS can insert test vectors, suspend and resume execution of simulation it and reproduce simulation status.A V₂Cloud system has been developed that automates these VHILS functions on a scalable computing resource. The V₂Cloud not only executes VHILS in parallel, but also abstracts the differences of types of simulation, structure of target systems and configuration of computers in order to hide them from developers and enable them to form an extensive set of test-vectors.The V₂Cloud system was applied to a safety validation process of an actual automotive control system. The system was prototyped on multiple types of cloud-computing resources. Moreover the results of cost statistics said that V₂Cloud can reduce simulation turn-around time enough to complete validation extensively.


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    Titel :

    Virtual Validation Cloud : An Electronic System Validation Platform Based on Cloud Computing Resources


    Weitere Titelangaben:

    Sae International Journal of Passenger Cars- Electronic and Electrical Systems
    Sae Int. J. Passeng. Cars - Electron. Electr. Syst


    Beteiligte:
    Oho, Shigeru (Autor:in) / Ito, Yasuhiro (Autor:in) / Sugure, Yasuo (Autor:in)

    Kongress:

    SAE 2012 World Congress & Exhibition ; 2012



    Erscheinungsdatum :

    2012-04-16


    Format / Umfang :

    11 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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