Measurement of hemispherical total emittance, ε H material for cryogenic engineering in the temperature range of 10∼50K is proposed. This measurement is based on calorimetric method and ε H is obtained by measuring a sample temperature corresponding to heat input to a sample heater. In order to verify this method, the parameter ε H is analyzed for a test chamber by using a thermal mathematical model.


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    Titel :

    Measurement of Hemispherical Total Emittance in Cryogenic Temperature


    Weitere Titelangaben:

    Sae Technical Papers


    Beteiligte:
    Ohnishi, Akira (Autor:in)

    Kongress:

    International Conference On Environmental Systems ; 1994



    Erscheinungsdatum :

    1994-06-01




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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