This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers. The committee reviewed this information report and determined that no substantial changes were needed. The reference section was reformatted and updated.
Test Device Head Contact Duration Analysis
05.01.2011
Aufsatz (Konferenz)
Englisch
Test Device Head Contact Duration Analysis
SAE | 2005
TEST DEVICE HEAD CONTACT DURATION ANALYSIS
SAE | 1997
TEST DEVICE HEAD CONTACT DURATION ANALYSIS
SAE | 1990
Test Device Head Contact Duration Analysis
SAE | 2016
Effect of Long-Duration Impact on Head
SAE | 1972
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